Showing results: 3226 - 3240 of 4427 items found.
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Echola Systems LLC
Echola's Optical Patch Panel Automation switch allows test engineers/system developers to dynamically reconfigure testbed connections from remote. It reduces test configuration time as they don't need to make any physical fiber connections for each set of tests, so more testing can be performed with fewer resources. It provides all-optical connectivity with zero latency and can be used with any protocols and speed. Unlike O-E-O (optical to electrical to optical conversion) switches you don't need expensive transceivers for each port. The all-optical connectivity also allows systems under test to be tested without introducing another variable (ie, another conversion layer which could introduce significant latency). The patch panel automation switch allows users to configure, control and monitor the device from remote using any standard internet browser, a command line interface (CLI) via Telnet or SSH and SNMP v2c. The event notifications are supported through Syslog. It can be automated using TCL based scripts.
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MRC Series -
Jinan Testing Equipment IE Corporation
MRC series mechanical creep and rupture testing machine with single-lever structure is designed for long-term creep and stress rupture test applications. The series mechanical creep and rupture testing system is mainly for the metallic materials under room or elevated temperature according to GB/T2039, GB/T 20120, EN ISO 204-2009 and ASTM E139. The creep and rupture testing machine can also maintain constant loads for extended periods of time. Through the mechanical advantage of the lever arm loading system, constant loads can be maintained with a high degree of accuracy for long duration. This creep and rupture tester uses dead weights without continuous operation and the dependency of a mechanically powered drive. The creep and rupture testing system is an ideal equipment for metallurgy manufacturer, research institute, colleges and other relevant factories and mines.
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MicroContact AG
The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a review station where the operator can assess and evaluate the errors on the monitor. If the operator is uncertain about a fault, the ceramic in question can be positioned under the microscope position and inspected by eye. Poorly defined ceramics are marked accordingly with an ink pen.
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S930707B -
Keysight Technologies
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930700B -
Keysight Technologies
S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930702B -
Keysight Technologies
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930705B -
Keysight Technologies
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930709B -
Keysight Technologies
S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930701B -
Keysight Technologies
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930712B -
Keysight Technologies
S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930704B -
Keysight Technologies
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930713B -
Keysight Technologies
S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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ETL-35 -
Kharkovenergopribor Ltd.
ETL-35 is a cable test van designed for testing electrical substation equipment.Apart from cable insulation withstand testing with DC (rectified) voltage up to 60 kV and ability to measure very small leakage currents, the system can be used for testing various objects with small electrical capacitance with AC voltage of up to 100 kV and measuring dielectric dissipation factor (Tan Delta) at industrial frequency.
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Venture -
SV Probe, Inc.
SV TCL's VentureTM line of cantilever probe cards, represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Our Venture FX™ fine pitch cantilever cards are ideal for LCD driver testing, with higher probe counts for greater density bond pad layouts.
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Electro-Tech Systems, Inc.
Standard Environments: ETS' multi-purpose benchtop units for laboratory and production use are large enough to accommodate testing and fabrication, as well as storage of materials, test equipment, and assemblies, yet they are small enough to fit on a standard workbench. The systems are able to independently maintain humidity from <5% to >95% RH and temperature from -22F to 122F (-35 to 50C) when unit is placed in an ambient environment location.
